Industrial Detection
Scintillators excel in industrial detection, accurately detecting radiation and widely used for material testing and thickness measurements. They enhance detection efficiency and accuracy, ensuring the quality and safety of industrial production, making them invaluable assistants in the field. NaI is favored for its strong absorption of X and Y rays, while CsI shines due to its high sensitivity, providing robust support for industrial development.
Scintillation crystals are fundamental components in industrial radiation detection instruments, including X-ray and gamma-ray based non-destructive testing (NDT) systems, industrial computed tomography (CT) scanners, thickness gauges, and level measurement devices. The crystal converts ionizing radiation into a measurable optical signal, enabling precise analysis of material composition, internal structure, and dimensional properties without damaging the inspected part.
EBO manufactures scintillation crystals and detector arrays for industrial inspection equipment manufacturers, NDT system integrators, and industrial measurement instrument producers.
In an industrial X-ray or gamma-ray inspection system, radiation passes through the component under test. The transmitted or scattered radiation is captured by a scintillation crystal detector array positioned on the far side. Each crystal element converts the radiation energy into light proportional to the intensity received at that position. A coupled photodetector array reads out these signals to form an image or measurement profile that reveals internal defects, voids, density variations, or dimensional deviations.
For thickness gauging and level sensing applications, the attenuation of radiation through the material is continuously measured and related to physical thickness or fill level.
NaI(Tl) is widely used in gamma-based industrial gauging and process monitoring instruments. Its high light output and reliable energy response make it suitable for thickness measurement, fill-level detection, and environmental radiation monitoring in industrial plants.
CsI(Tl) is employed in large-area detector arrays for industrial X-ray imaging, offering high sensitivity and good energy response across a broad X-ray energy range.
EBO fabricates custom-specification scintillation crystals and arrays for integration into industrial detector systems. Typical customization requests include:
● Crystal material selection based on energy range, required sensitivity, and operating environment
● Array size and pixel pitch matched to the detector module geometry
● Reflector material between pixels to control optical isolation and spatial resolution
● Surface preparation and optical coatings for coupling to photodiode or SiPM arrays
● Large single-crystal elements for gamma gauge and survey instrument applications
Contact EBO with your technical specifications to discuss crystal selection and custom fabrication options.
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